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Metrology and Physical Mechanisms in New Generation Ionic Devices

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Metrology and Physical Mechanisms in New Generation Ionic Devices

Umberto Celano

Springer
Collection: Springer Theses
Publication date : 2016-06-18

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This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.

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About the book

Author

Umberto Celano

Imprint

Springer

Collection

Springer Theses

Publication date

2016-06-18

Pages

175 pages

Print ISBN

9783319395302

Language

English

Ebook informations

EAN EPUB

9783319395319

Price

£89.50

Copy count 1

Print count 17

File size 4383 Ko

Informations accessibility

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About author(s)

Umberto Celano

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