Account
Orders
Advanced search
Louise Reader
Read on Louise Reader App.
This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer returns. Readers will be enabled to deal with huge amount of insightful test data that cannot be exploited otherwise in an efficient, timely manner. After some background on fault diagnosis and machine learning, the authors explain and apply optimized techniques from the ML domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing. These techniques can be used for failure isolation in logic or analog circuits, board-level fault diagnosis, or even wafer-level failure cluster identification. Evaluation metrics as well as industrial case studies are used to emphasize the usefulness and benefits of using ML-based diagnosis techniques.
Les livres numériques peuvent être téléchargés depuis l'ebookstore Numilog ou directement depuis une tablette ou smartphone.
PDF : format reprenant la maquette originale du livre ; lecture recommandée sur ordinateur et tablette EPUB : format de texte repositionnable ; lecture sur tous supports (ordinateur, tablette, smartphone, liseuse)
DRM Adobe LCP
LCP DRM Adobe
This ebook is DRM protected.
LCP system provides a simplified access to ebooks: an activation key associated with your customer account allows you to open them immediately.
ebooks downloaded with LCP system can be read on:
Adobe DRM associates a file with a personal account (Adobe ID). Once your reading device is activated with your Adobe ID, your ebook can be opened with any compatible reading application.
ebooks downloaded with Adobe DRM can be read on:
mobile-and-tablet To check the compatibility with your devices,see help page
Sign up to get our latest ebook recommendations and special offers