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Trap Level Spectroscopy in Amorphous Semiconductors

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Trap Level Spectroscopy in Amorphous Semiconductors

Victor V. Mikla, Victor I. Mikla

Elsevier
Publication date : 2010-06-11

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Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most common spectroscopic techniques but also describes their advantages and disadvantages. - Provides information on the most used spectroscopic techniques - Discusses the advantages and disadvantages of each technique

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About the book

Author

Victor V. Mikla , Victor I. Mikla

Imprint

Elsevier

Collection

n.c

Publication date

2010-06-11

Pages

128 pages

Print ISBN

9780123847157

Language

English

Ebook informations

EAN EPUB DRM-FREE

9780123847164

Price

£100.22

Informations accessibility

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About author(s)

Victor V. Mikla

Victor I. Mikla

Dr. Victor V. Mikla is affiliated with the Physical & Mathematical Disciplines, Department of Humanities & Natural Sciences, Uzhhgorod National University, Uzhhgorod,UkraineVictor I. Mikla, PhD, is Chair of Physical & Mathematical Disciplines in the Department of Humanities & Natural Sciences at Uzhhgorod National University, Uzhhorod, Ukraine. Dr. Mikla specializes in photo-electronic materials and devices, and has published research articles widely on a broad range of inter-disciplinary topics including metastable states in amorphous chalcogenides, trap level spectroscopy, medical and non-medical imaging applications of amorphous semiconductors, xerographic spectroscopy, photo-induced & structural changes, and raman scattering.

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