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Principles of Semiconductor Network Testing

Principles of Semiconductor Network Testing

Amir Afshar

Newnes
Publication date : 1996-04-22

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Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources. - Introduces a novel component-testing philosophy for semiconductor test, product and design engineers - Best new source of information for experienced semiconductor engineers as well as entry-level personnel - Eight chapters about semiconductor testing

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About the book

Author

Amir Afshar

Imprint

Newnes

Collection

n.c

Publication date

1996-04-22

Pages

350 pages

Print ISBN

9780750694728

Language

English

Ebook informations

EAN PDF DRM-FREE

9780080539560

Price

£46.41

Informations accessibility

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About author(s)

Amir Afshar

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