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Surface Analysis with STM and AFM

Surface Analysis with STM and AFM

Experimental and Theoretical Aspects of Image Analysis

Sergei N. Magonov, Myung-Hwan Whangbo

Wiley-VCH
Publication date : 2008-09-26

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Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations.

Practical examples are taken from:

* inorganic layered materials
* organic conductors
* organic adsorbates at liquid-solid interfaces
* self-assembled amphiphiles
* polymers

This book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field.

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About the book

Author

Sergei N. Magonov , Myung-Hwan Whangbo

Imprint

Wiley-VCH

Collection

n.c

Publication date

2008-09-26

Pages

335 pages

Print ISBN

9783527293131

Language

English

Ebook informations

EAN PDF

9783527615100

Price

£110.77

Copy count 0

Print count 335

File size 20204 Ko

Informations accessibility

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About author(s)

Sergei N. Magonov

Myung-Hwan Whangbo

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