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Secondary Ion Mass Spectrometry

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Secondary Ion Mass Spectrometry

An Introduction to Principles and Practices

Paul Van Der Heide

Wiley
Publication date : 2014-08-19

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Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS)
• Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations
• Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission
• Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS)
• Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions
• Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other

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About the book

Author

Paul van der Heide

Imprint

Wiley

Collection

n.c

Publication date

2014-08-19

Pages

384 pages

Print ISBN

9781118480489

Language

English

Ebook informations

EAN PDF

9781118916766

Price

£100.99

Copy count 0

Print count 384

File size 10598 Ko

Informations accessibility

EAN EPUB

9781118916773

Price

£98.99

Copy count 0

Print count 384

File size 13435 Ko

Informations accessibility

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About author(s)

Paul van der Heide

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