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Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging...
This latest volume in the Wavelets Analysis and Its Applications Series provides significant and up-to-date insights into recent developments in the field of wavelet constructions in connection with partial differential equations. Specialists in numerical applications...
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