All ebooks by Ben Kaczer in EPUB

Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

Jacopo Franco , Guido Groeseneken , Ben Kaczer

Due to the ever increasing electric fields in scaled CMOS devices, reliability is becoming a showstopper for further scaled technology nodes. Although several groups have already demonstrated functional Si channel devices with aggressively scaled Equivalent Oxide...