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VLSI Test Principles and Architectures

VLSI Test Principles and Architectures

Design for Testability

Cheng-Wen Wu, Laung-Terng Wang, Xiaoqing Wen

Morgan Kaufmann
Publication date : 2006-08-14

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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

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About the book

Author

Cheng-Wen Wu , Laung-Terng Wang , Xiaoqing Wen

Imprint

Morgan Kaufmann

Collection

n.c

Publication date

2006-08-14

Pages

808 pages

Print ISBN

9780123705976

Language

English

Ebook informations

EAN PDF DRM-FREE

9780080474793

Price

£55.90

Informations accessibility

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About author(s)

Cheng-Wen Wu

Laung-Terng Wang

Xiaoqing Wen

Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).

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