All ebooks by José Pineda de Gyvez in PDF

1 Book(s)


Add to my wish list Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits José Pineda De Gyvez , Manoj Sachdev Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits have been found to be... Publication date: 2007-06-04 Format: PDF Publisher: Springer Collection: Frontiers in Electronic Testing Add to basket £179,50

Add to my wish list

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

José Pineda De Gyvez , Manoj Sachdev

Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits have been found to be...

Publication date: 2007-06-04

Format: PDF

Publisher: Springer

Collection: Frontiers in Electronic Testing

Add to basket

£179,50

Les livres numériques peuvent être téléchargés depuis l'ebookstore Numilog ou directement depuis une tablette ou smartphone.

PDF : format reprenant la maquette originale du livre ; lecture recommandée sur ordinateur et tablette
EPUB : format de texte repositionnable ; lecture sur tous supports (ordinateur, tablette, smartphone, liseuse)

Votre support de lecture	Format	Protection	Application
Ordinateur	-EPUB -PDF	DRM Adobe LCP	Lecture en ligne (streaming) Adobe Digital Editions(DRM Adobe) Thorium Reader (LCP)
Tablette et smartphone iOS / Android	EPUB PDF	LCP DRM Adobe	Application Louise Reader : IOS / Android(ne lit pas les fichiers protégés par Adobe DRM) Adobe Digital Edition : IOS/Android(Lit uniquement la DRM Adobe)
Liseuse	EPUB	DRM Adobe	Module de lecture de la liseuse
Liseuse Diva	EPUB	LCP DRM Adobe	Module de lecture de la liseuse Diva

Consultez l’aide pour en savoir plus.