All ebooks by Yale Strausser in PDF

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Add to my wish list Characterization in Silicon Processing Yale Strausser This volume is devoted to the consideration of the use use of surface, thin film and interface characterization tools in support of silicon-based semiconductor processing. The approach taken is to consider each of the types of films used in silicon devices individually... Publication date: 2013-10-22 Format: PDF DRM-free Publisher: Newnes Add to basket £46,41

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Characterization in Silicon Processing

Yale Strausser

This volume is devoted to the consideration of the use use of surface, thin film and interface characterization tools in support of silicon-based semiconductor processing. The approach taken is to consider each of the types of films used in silicon devices individually...

Publication date: 2013-10-22

Format: PDF DRM-free

Publisher: Newnes

Add to basket

£46,41

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