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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials

Angus Kingon , Yossi Rosenwaks , Paula M. Vilarinho

As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an...