All ebooks by Feifei He in EPUB

1 Book(s)


Add to my wish list Electromigration Modeling at Circuit Layout Level Feifei He , Cher Ming Tan Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels.... Publication date: 2013-03-16 Format: ePub Publisher: Springer Collection: SpringerBriefs in Applied Sciences and Technology Add to basket £44,99

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Electromigration Modeling at Circuit Layout Level

Feifei He , Cher Ming Tan

Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels....

Publication date: 2013-03-16

Format: ePub

Publisher: Springer

Collection: SpringerBriefs in Applied Sciences and Technology

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£44,99

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